Atom-probe field ion microscopy: Principle and applications.
نویسندگان
چکیده
منابع مشابه
Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy
Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscale microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy i...
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Figure 2. Angular distributions of inelastic scattering around the undiffracted beam and around a beam diffracted through an angle a. The shaded area represents the contribution from the diffracted beam to the intensity collected by an on-axis aperture of semi-angle A3. [6] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986). [7] Steele, J...
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ژورنال
عنوان ژورنال: Hyomen Kagaku
سال: 1985
ISSN: 0388-5321,1881-4743
DOI: 10.1380/jsssj.6.222